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Parametre
Viac o knihe
Scientific reviews on scanning tunneling microscopy and atomic force microscopy Integrates basic scientific and applicational aspects With a foreword by the co-inventor of AFM, Christoph Gerber Useful reference to researchers and graduate students
Nákup knihy
Scanning Probe Microscopy in Nanoscience and Nanotechnology, Bharat Bhushan
- Jazyk
- Rok vydania
- 2016
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Doručenie
Platobné metódy
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